Desktop-SEM Phenom XL
Scanning electron microscopy is used to examine surfaces and structures of technical materials. In contrast to conventional microscopy methods, a resolution in the nanometer range in combination with a high depth of focus is achieved. By means of a secondary electron detector the topography of fracture surfaces, for example, is analyzed to assess the failure mechanism. Backscattered electrons detector is used to detect contrast between areas with different chemical compositions. Furthermore, the chemical composition of the materials is determined quantitatively using energy-dispersive X-ray spectroscopy. Here, all elements of the ordinal numbers 4 < Z < 95 can be measured. The use of different vacuum modes also enables the analysis of electrically conductive as well as non-conductive materials, such as ceramic coatings. The "Mapping & Linescan" software add-on makes it possible to determine the element distribution over a defined imaging area of the sample and thus to display possible enrichments of elements in color, so that diffusion processes of heat-treated samples can be traced. With the additional function "Particle Metric" particle size distributions and shapes can be easily analyzed and evaluated with the help of automatically generated histograms. Due to the large working space, corresponding samples can be analyzed without prior cutting and thus non-destructively. Typical application examples for SEM-investigations include brazed or welded joints, thermally sprayed coatings or coatings applied by physical vapor deposition as well as cast components.
Technical data:
| Parameter, [Einheit] | Wert |
|---|---|
| Available detectors | SE-Detektor RSE-Detektor EDS-Detektor |
| Vacuum modes, p [Pa] | 1 – 60 |
| Working space, l x w x h [mm] | ≤ 100 x 100 x 45 |