X-Ray Diffractometer XRD 3000

 

Fundamental research and development of materials require detailed knowledge of the phase composition and the internal stress characteristics. The x-ray diffractometry (XRD) is suitable for obtaining this information. The operating principle of the XRD 3000 x-ray diffractometer, GE Energy Germany GmbH, Ratingen, Germany, is based on the physical effect of x-ray diffraction on crystal structures. The system allows radiographic analysis of powder-formed materials and coating systems at room temperature and up to T = 1,600 °C in vacuum or a defined atmosphere. Focused beams sent from the x-ray tube and diffracted by the crystal lattice produce a certain level of intensity in the detector. The intensity maxima, so called peaks, are characteristic for the lattice spacing of the specimens and allow the phase determination. In addition to the classical texture and phase analysis, the in-situ phase and oxidation stability can be characterized using a high temperature chamber.

Technical data:

Parameter, [unit]	value
Cu cathode wavelength, λCu [Å]	1.540598
Co cathode wavelength, λCo [Å]	1.789007
Max. cathode voltage, U [kV]	60
Max. cathode current, I [mA]	50
Range of angles theta axis, θ [°]	0-120